Solid-State Electronics
10.1016/j.sse.2019.03.033
2019
Characterization and Modeling of 28-nm FDSOI CMOS Technology down to Cryogenic Temperatures
Beckers, Arnout; Jazaeri, Farzan; Bohuslavskyi, Heorhii; Hutin, Louis; De Franceschi, Silvano; Enz, Christian
سوال امنیتی
